3D orientation data – A comparison of diffraction contrast tomography and serial sectioning electron backscatter diffraction for the nickel-base superalloy IN738LC

authored by
Silvia Reschka, Gregory Gerstein, Sebastian Herbst, Lukas Munk, Peter Wriggers, Hans Jürgen Maier
Abstract

For specimen characterization, X-ray microscopy offers a variety of advantages like non-destructive investigations and reduced preparation effort for the samples. Orientation measurements are possible using diffraction contrast tomography (DCT). However, lateral resolution is lower as compared to scanning electron microscopy combined with electron backscatter diffraction (EBSD). A sample of a nickel-based superalloy IN738LC was investigated three-dimensionally for direct comparison of EBSD and DCT, which clearly reveals the advantages, disadvantages and limits of both methods. Images obtained by EBSD showed more microstructural details, but also artefacts resulting from the previous sample preparation. DCT seemed more suitable for 3D-imaging, but was not able to resolve some of the smaller grains.

Organisation(s)
Institute of Materials Science
Institute of Continuum Mechanics
Type
Article
Journal
Materials letters
Volume
262
ISSN
0167-577X
Publication date
01.03.2020
Publication status
Published
Peer reviewed
Yes
ASJC Scopus subject areas
Materials Science(all), Condensed Matter Physics, Mechanics of Materials, Mechanical Engineering
Electronic version(s)
https://doi.org/10.1016/j.matlet.2019.127177 (Access: Closed)
 

Details in the research portal "Research@Leibniz University"