The analyses of dynamic response and reliability for failure-dependent stochastic micro-resonator with thermoelastic coupling effects

authored by

Bin Yan, Juan Ma, Di Wu, Peter Wriggers

Organisation(s)

Institute of Continuum Mechanics

External Organisation(s)

Xidian University
University of New South Wales
Xi'an Microelectronics Technology Institute

Type

Article

Journal

Applied mathematical modelling

Volume

77

Pages

1168-1187

No. of pages

20

ISSN

0307-904X

Publication date

01.2020

Publication status

Published

Peer reviewed

Yes

ASJC Scopus subject areas

Modelling and Simulation, Applied Mathematics

Electronic version(s)

https://doi.org/10.1016/j.apm.2019.09.040 (Access: Closed)