The analyses of dynamic response and reliability for failure-dependent stochastic micro-resonator with thermoelastic coupling effects

authored by
Bin Yan, Juan Ma, Di Wu, Peter Wriggers
Organisation(s)
Institute of Continuum Mechanics
External Organisation(s)
Xidian University
University of New South Wales
Xi'an Microelectronics Technology Institute
Type
Article
Journal
Applied mathematical modelling
Volume
77
Pages
1168-1187
No. of pages
20
ISSN
0307-904X
Publication date
01.2020
Publication status
Published
Peer reviewed
Yes
ASJC Scopus subject areas
Modelling and Simulation, Applied Mathematics
Electronic version(s)
https://doi.org/10.1016/j.apm.2019.09.040 (Access: Closed)