Functional NiTi grids for in situ straining in the TEM

authored by
Ulrich Schürmann, Christoph Chluba, Niklas Wolff, Daria Smazna, Rodrigo Lima De Miranda, Philipp Junker, Rainer Adelung, Eckhard Quandt, Lorenz Kienle
Abstract

In situ measurements are a pivotal extension of conventional transmission electron microscopy (TEM). By means of the shape memory alloy NiTi thin film Functional Grids were produced for in situ straining as alternative or at least complement of expensive commercial holders. Due to the martensite-austenite transition temperature straining effects can be observed by use of customary heating holders in the range of 50 to 100  °C. The grids can be produced in diversified designs to fit for different strain situations. Micro tensile tests were performed and compared with finite element simulations to estimate the applied forces on the sample and to predict the functionality of different grid designs. As a first example of this Functional Grid technology, we demonstrate the impact of applying a strain to a network of ZnO tetrapods.

Organisation(s)
Institute of Continuum Mechanics
Type
Article
Journal
Ultramicroscopy: a journal committed to the advancement of new methods, tools and theories in microscopy
Volume
182
Pages
10-16
No. of pages
7
Publication date
11.2017
Publication status
Published
Peer reviewed
Yes
ASJC Scopus subject areas
Electronic, Optical and Magnetic Materials, Atomic and Molecular Physics, and Optics, Instrumentation
Electronic version(s)
https://doi.org/10.1016/j.ultramic.2017.06.003 (Access: Closed)
 

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